gt; gt;Please click here to download the English manual lt; lt;
?Description:
FNIRSI-TC2 ingeniously integrates digital oscilloscope, electronic component tester, PWM signal generator and other functions into one.Equipped with large-size color dot matrix TFT display.Built-in rechargeable lithium battery.Bring more practical functions to users with a small size,Also has good portability.
FNIRSI-TC2 has various working modes such as oscilloscope and component tester.Each time you click the power button, it will enter the mode selection interface.Press the \\\'Up\\\' and \\\'Down\\\' keys of the direction keys to select,Select \\\'Mos Test\\\' , press\\\'OK\\\'key to enter component tester mode;Select the \\\'Oscilloscope\\\' , press\\\'OK\\\'key to enter the oscilloscope mode
\\\'Mos Test\\\' mode can test various types of transistors, and can identify device type, pin polarity, hFE, turn-on voltage, junction capacitance; can test capacitance, resistance, inductance components, etc.
FNIRSI-TC2 is especially suitable for fast pairing of transistors, identification of mixed surface mount and wordless components, and preliminary screening of small batch components.
\\\'Oscilloscope\\\' mode to test the signal waveform of the circuit.Support online operation with computer, you can refresh the official firmware by yourself and complete the upgrade.
It is hoped that FNIRSI-TC2 can make the study and work of the majority of users more efficient and interesting.
Technical Parameter:
FNIRSI DSO-TC2 Equipment Parameters:
Display: 2.4 inch TFT color screen, LED backlight
Powered by: 1500mAh rechargeable lithium battery
Charging: USB Type-C, +5V
Size: 79 x 31 x 103mm (L x W x H)
Bracket: Hidden Support fram
Specifications Of Oscilloscope Mode:
The oscilloscope has a real-time sampling rate of 2.5MS/s and a 200kHz bandwidth
With complete trigger function (Single, Normal, Automatic), it can be used freely for both periodic analog signals and aperiodic digital signals
Up to plusmn;400V voltage signal can be measured
Equipped with efficient one-key AUTO, the measured waveform can be displayed without cumbersome adjustment
Self-contained 80kHz /5.0V PWM wave test signal source with adjustable duty cycle
Technical Parameters Of Transistor:
This instrument can automatically identify and measure various transistors.Including NPN and PNP transistors, N-channel and P-channel field effect transistors, junction field effect transistors, diodes, double diodes, thyristors, etc.,and passive components such as resistors, inductors, capacitors, etc.
Automatic detection of pin definitions
It can automatically parse the infrared code of the NEC protocol
Other functional modes: including circuit continuity test, 0~16V input voltage measurement, PWM output, 0~24V Zener diode measurement, DS18B20 temperature sensor measurement, DHT11 temperature and humidity sensor measurement, etc.
SCRS
Turn-on voltage lt;5V, gate trigger current lt;6mA
Gate voltage
Triac
Capacitance
25pF ?100mF
Capacitance value, loss factor Vloss ⑤
Resistance
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Key Features
gt; gt;Please click here to download the English manual lt; lt;
FNIRSI-TC2 ingeniously integrates digital oscilloscope, electronic component tester, PWM signal generator and other functions into one.Equipped with large-size color dot matrix TFT display.Built-in rechargeable lithium battery.Bring more practical functions to users with a small size,Also has good portability.
FNIRSI-TC2 has various working modes such as oscilloscope and component tester.Each time you click the power button, it will enter the mode selection interface.Press the \\\'Up\\\' and \\\'Down\\\' keys of the direction keys to select,Select \\\'Mos Test\\\' , press\\\'OK\\\'key to enter component tester mode;Select the \\\'Oscilloscope\\\' , press\\\'OK\\\'key to enter the oscilloscope mode
\\\'Mos Test\\\' mode can test various types of transistors, and can identify device type, pin polarity, hFE, turn-on voltage, junction capacitance; can test capacitance, resistance, inductance components, etc.
FNIRSI-TC2 is especially suitable for fast pairing of transistors, identification of mixed surface mount and wordless components, and preliminary screening of small batch components.
